Atomic Force Microscope offers scanning microwave microscopy. Compatible with Model 5500 AFM, Scanning Microwave Microscopy mode combines compound, calibrated electrical measurement capabilities of microwave vector network analyzer with spatial resolution of atomic force microscope. SMM nose cone is particularly useful for testing and characterizing semiconductors. It enables complex impedance measurements, and can be used to acquire calibrated capacitance ...
July 3, 2013 - ThomasNet