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• n  the branch of electronics that deals with beams of electrons and their focusing and deflection by magnetic fields

News & Articles

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• FIB/SEM Systems facilitate imaging of challenging materials.
  DualBeam focused ion beam/scanning electron microscope (FIB/SEM) systems provide imaging and analysis of diverse samples. With electron optics suited for investigating such challenging materials as insulating or magnetic materials, Scios™ DualBeam™ is positioned for accelerated 2D and 3D characterization. Helios NanoLab™ 660 DualBeam, with its patterning engine, MultiChem&trade ...
  July 23, 2013 - ThomasNet